Burn-In, Reliability & Life Test
The Chroma 58601, is a high density, precision, multi SMU (Source- Measurement Unit) Module with temperature control and exchangeable interfaces. It has been developed for burn-in, reliability and life test of optoelectronic components including laser diodes, LEDs, OLEDs, photo-diodes and other similar components. Each module has up to 80 discrete SMUs which may be used as device drives, device biasing and/or measurement.
Five power levels are offered where discrete SMUs are available to 5-amps and series device drives for 20-40-amp (preliminary) sources. Discrete voltage measurements are available for high current devices placed in series. Multiple current sources may also be paralleled (exchanging the conversion interface board) to support higher power devices.
Chroma brings the Conversion Kit flexibility used in the semiconductor industry to optoelectronics. Through a Conversion Kit (conversion interface board & device carrier) the Chroma 58601 can be configured to other similar devices in minutes.