8800 Component Automatic Test System

8800 Component Automatic Test System

Product Overview

Chroma 8800 component automatic test system (ATS) is developed to effectively help manufacturers reduce test costs and product risks. The system is able to complete all measurements and tests in one single test program. This powerful feature save time and reduces human operation errors. The employment of open architecture software provides users with a flexible, powerful and cost effective automated test system that is deemed the best solution for component tests.

Chroma 8800 component automatic test system integrates different test instruments in the system based on test requirements. The open architecture software offers corresponding solutions by various test programs and products that give customers highly flexible test combinations. In addition, user expandable test items are provided for editing if new requirements arise.

This automatic test system uses unique test command optimization technology to prevent the repetitive control commands from sending to the system hardware devices. This technology improves the system test speed dramatically. Users create new test items based on their requirements using the test item editor. The users can expand the test items as needed.

Applications

  • RJ-45 equipment (including LAN Modules,Ethernet IC, PoE IC) test
  • Glass substrate test
  • LCD glass substrate test
  • Printed circuit glass (including touch panel) test
  • PCB test
  • EMI filter test
  • ICT applications
  • Category:

    Key Features

    • Open architecture software
    • Expandable hardware support
    • Supports instruments equipped with GPIB/RS232 or RS485 interface
    • User editable test library (test Items)
    • User editable test programs
    • Statistical report
    • User privilege control
    • Test item/ Program Release control
    • Activity log
    • Support Barcode reader
    • Test command editor helps to improve test speed
    • Comprehensive hardware modules provide highly accurate, repetitive measurements
    • High test throughput by system test items
    • High test throughput generated by system test items
    • Cost effective
    • Hardware expandable upon request
    • Windows ® 2000/ XP based software
    • * Test items can be customized or created via the test item editor based on the requirements of various UUTs.

    Application Notes

    Manufacturer

    Downloads

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