Y.I.C Near-Field Probe Kit

Y.I.C Near-Field Probe Kit

Y.I.C. Technologies’ NFP Kit is intended for measuring near-field emissions for EMC/EMI troubleshooting and pre-compliance testing.

These probes are used to find, identify, measure, and characterise potential electromagnetic radiation sources. It is also possible to locate interference radiated by traces or components of electronic PCBs, assemblies, cables, enclosures, or products. The probe output is proportional to the strength of the magnetic field (H) at the probe location.

  • Set of Near Field Probes
  • 10X Optical Zoon Mini USB Camera
  • 11 Inch Adjustable Support Arm
  • 1-year Subscription EMViewer Premium Software

Key Features

  • Fully integrated with Y.I.C. Technologies EMViewer
  • Live real-time probe position tracking
  • Normalization and correction
  • Flat response within the range of operation
  • Slim design and protective coating
  • Frequency 18GHz range

Application Notes

Manufacturer

Downloads

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