SGSA Impulse Voltage Test System 100 kV – 1200 kV

SGSA Impulse Voltage Test System 100 kV – 1200 kV

SGSA impulse test systems can be used to generate impulse
voltages simulating lightning strokes and switching surges.
The total charging voltage ranges from 10 kV to 1’200 kV with
a per-stage energy of 5 kJ. The system has all our experience
acquired, in building Impulse Generators since 1932, behind
it.

Applications covered include testing according to IEC,
ANSI/IEEE as well as other national standards.

A number of optional additional circuits and
components can be included to optimize the
impulse test system.

A control system rated to Safety Integrity
Level 3 charges the impulse generator
through the charging rectifier

SGSA generators are based on MARX multiplier
circuits. The stages in the impulse generator
are connected and charged in parallel via the charging
resistors. Charging time and charging voltage can be selected
by the operator.

Once the selected charging voltage has been reached, a trigger
pulse initiates firing of the first spark-gap of the impulse
generator. The resulting over-voltage triggers the successive
stages. As all the spark-gaps fire, the stages which are in series
now, multiply the charging voltage to reach the test voltage.

An impulse voltage divider reduces the impulse voltage to a
value that the measuring and recording instruments
can use.

The major impulse circuit elements such as capacitors
and resistors are arranged in an optimum
manner to simultaneously satisfy the two
major requirements, smallest possible internal
inductance and operating convenience.

The electronic measurement and control components
are designed and manufactured in-house.
Our many years of experience in dealing with electromagnetic
compatibility of electronic devices in high voltage
test bays provide the requisite expertise and a trouble-free
operation and a long service life are thereby ensured.

Advantages

  • Fits every application
  • Wide range of test objects covered
  • Heightened safety
  • Easy to configure
  • Easy relocation in the test field
  • Category: