Live tracking: A Rapid Handheld Probe Scanning Solution
Y.I.C. Technologies’ NFP Kit is intended for measuring near-field emissions for EMC/EMI troubleshooting and pre-compliance testing.
These probes are used to find, identify, measure, and characterise potential electromagnetic radiation sources. It is also possible to locate interference radiated by traces or components of electronic PCBs, assemblies, cables, enclosures, or products. The probe output is proportional to the strength of the magnetic field (H) at the probe location.
