We would like to invite you to join a Live Webinar, hosted by Y.I.C. Technologies. We appreciate that it is a difficult time for businesses, but we would like to take this opportunity to get in touch and address EMI/EMC design & troubleshooting.
Other topics will follow during the year.
EMI/EMC DESIGN AND TROUBLESHOOTING WITH NEAR FIELD SCANNING TOOLS
5th May 2020 at 11:00 CET.
Enjoy a really practical and useful lecture discovering the fundamentals of practical EMI/EMC design and troubleshooting electronic circuits using near field scanning tools.
Discover really powerful design and troubleshooting techniques along with tools to “see” and “feel” your problems.
Prof. Arturo Mediano | University of Zaragoza