This application note looks at protecting devices from high inrush currents and provides a method and considerations necessary in specifying the inrush current protection needed for an example device.

Long title to answer a simple question: “Is it plugged in?”. Annoying, yet true. How to determine if a DUT is connected, using the low trip limit.

Testing to IEC60601 Standards: Leakage Current, Dielectric Breakdown, Insulation Resistance, and Ground Bond.
There are a number of areas of safety testing, which include leakage current, dielectric breakdown, insulation resistance, and ground bond testing. To understand the differences in these tests and others, we will examine the purpose and techniques for each.

This application note illustrates how to effectively perform electrical safety testing of IMD’s with feedthroughs.